Freiberg Instruments Single Crystal XRD Orientator
Main milestones:
1961- EFG GmbH was founded by Arthur Bradachek of the X-ray Ing. group and his son Hans Bradachek.
◆1969- Developed the world's first integrated circuit based X-ray detection and counting device, named COUNTIX 130.
◆ 1989- Developing the Omega Scan method
BOSCH requires the provision of a directional measurement system for circular quartz blanks- Oscillator production increased from 50% to 95%
◆ 2005- Transfer Omega to other materials such as SiC, sapphire, GaN, GaAS, Si, Ni based high-temperature alloys
2010- Launch of desktop X-ray diffractometer (DDCOM) for crystal orientation measurement
Approximately 150 quartz sorting systems sold worldwide
◆2015- X-ray technology and EFG GmbH merged into Freiberg Instruments GmbH
Inheriting 60 Years of German Craftsmanship Spirit - Third Generation X-ray Engineers
The characteristics of crystal ingot XRD:
◇ High precision
◇Fast measurement speed:<5 seconds/sample
◇Typical standard deviation inclination (e.g. Si 100):<0.003 °, extremely small<0.001 °.
◇Automatic alignment of ingots
◇Automatic positioning of film
◇Optical measurement of geometric characteristics of ingots and/or ground ingots (flat edge, Notch groove position)
◇Automatic labeling of ingots
◇Easy to integrate into the production line (manual or robot loading).
◇Data Matrix Code (DMC) Reader
◇MES interface; SECS/GEM or similar interface
◇Crystal ingots with a diameter of 300 millimeters and a length of 520 millimeters
Ingot XRD prepared for manual loading
