XRD-OEM online X-ray diffractometer

Characteristics of XRD-OEM ▼

• Can integrate any automation or processing system and be suitable for extreme environments (grinding, sawing)

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• Compact and standard industrial interface

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• Individual positioning measurement, capable of measuring planes or circles

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• Optical grade detection

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• Solved industry challenges:

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1. If the processing equipment and orientation measurement are separate, it will cause orientation errors due to sample transfer

2. The demand for precisely aligned wafers in the market is increasing

• Integrating measurement processes into industrial production (grinding or sawing)

XRD-OEM is compatible with common polishing equipment ▼

No need to move samples for orientation, can be combined with polishing production line for online detection directly

Application Example ▼

• Silicon ingot orientation
• Detection of plane and notch positions before grinding
• The sample can have a diameter of up to 8 "and a length of up to 40 centimeters

Technical parameters ▼

• Measurable materials: silicon, silicon carbide, gallium arsenide, and more
• Sample size: Steel ingot diameter 450 millimeters
• Cooling: air, low noise
• Possible use: Pre align large ingots before sawing/grinding/flattening/notch detection