Freiberg Instruments Single Crystal XRD Orientator
Main milestones:
1961- EFG GmbH was founded by Arthur Bradachek of the X-ray Ing. group and his son Hans Bradachek.
◆1969- Developed the world's first integrated circuit based X-ray detection and counting device, named COUNTIX 130.
◆ 1989- Developing the Omega Scan method
BOSCH requires the provision of a directional measurement system for circular quartz blanks- Oscillator production increased from 50% to 95%
◆ 2005- Transfer Omega to other materials such as SiC, sapphire, GaN, GaAS, Si, Ni based high-temperature alloys
◆2010- Launching a desktop X-ray diffractometer (DDCOM) for crystal orientation measurement
Approximately 150 quartz sorting systems sold worldwide
◆2015- X-ray technology and EFG GmbH merged into Freiberg Instruments GmbH
Inheriting 60 Years of German Craftsmanship Spirit - Third Generation X-ray Engineers
Product advantages:
◆Adopting Omega scan scanning method (patented technology)
◆Fast testing speed: 5s
◆High angle measurement accuracy: 0.003
◆Featuring both XRD orientation and Flat/Norch functionality
◆Grinding and polishing directional solution
◆Patented technology for crystal ingot bonding transfer (stacking)）Specially designed for the SiC industry, it is favored by many leading SiC substrate companies, such as II-VI Advanced Materials, SiCrystal, etc. Three quarters of foreign silicon carbide manufacturers rely on Freiberg Instruments' crystal orientation measurement technology, greatly improving production efficiency and product quality.
◆ Mapping surface scanning function, swing curve measurement
◆Easy to integrate into the production line
◆MES and/or SECS/GEM interfaces
◆Typical standard deviation of inclination (e.g. Si 100):<0.003 °, less than<0.001 °
The Omega/Theta X-ray diffractometer is a fully automatic vertical triaxial diffractometer used for orientation determination and rocking curve measurement of various crystals using the Omega Scan and Theta Scan methods. The large and spacious design can accommodate samples and sample racks up to 450 millimeters in length and 30 kilograms in weight.
All measurements are automated and can be accessed from a user-friendly software interface. By using Omega scanning, the complete lattice direction can be determined during crystal rotation (5 seconds). Theta scanning is more flexible, but each scan can only obtain one orientation component.The inclination angle can be determined with very high accuracy; Using Theta scanning can achieve 0.001 °. For all other crystal directions, accuracy depends on the angle difference perpendicular to the surface.
The system is modular and equipped with many different extensions for special purposes such as shape or plane determination, drawing, and different sample racks. The tilt of the sample is detected through optical measurement and can be used to correct the resulting direction.
Single crystal diffractometer orientation instrument:
◆Fully automatic and complete measurement of single crystal lattice orientation
◆Ultra fast crystal orientation measurement using Omega scanning method
◆Automatic rocking curve measurement function
◆The angular resolution of the diffractometer is 0.1 arcseconds.
◆The sample size can reach 450 millimeters
◆Applicable to production quality control and research
User friendly and cost-effective:
◆Convenient sample processing and easy operation
◆Advanced and user-friendly software
◆Low energy consumption and operating costs
◆Modular design with strong flexibility
◆Various upgrade options
◆Customize according to user requirements
Optional features:
◆Automatic Mapping Face Scan Function
◆Omega/Theta -Patent technology for crystal ingot bonding transfer (stacking)
◆Omega/Theta - Measurement of rocking curve
◆Omega/Theta - Customized sample stage
◆Laser scanner for sample shape measurement
◆Optical detection for flat and groove detection
◆Additional sample rotation axis for 3D drawing
◆Secondary channel cutting collimator (analyzer)
◆Equipment for sample adjustment