The advanced 16 megapixel CMOS X-ray detector can provide high contrast images with excellent resolution. The increased detector field of view and enhanced X-ray sensitivity can shorten scanning time by two times.
Brand: Brooke
Model: SKYSCAN 1272
Minimum order quantity: 1
Unit: Unit
Packaging instructions: Standard shipping packaging
SKYSCAN 1272 CMOS
With Genius mode, parameters can be automatically selected. With just one click, you can automatically optimize magnification, energy, filtering, exposure time, and background correction.
Moreover, by allowing the sample and large-sized CMOS detector to be as close as possible to the light source, it can significantly increase the measured signal intensity. It is precisely for this reason that the scanning speed of SKYSCAN 1272 CMOS is five times faster than that of conventional systems with fixed detector positions.
SKYSCAN 1272 CMOS can be paired with an external automatic sampler with 16 positions to increase processing speed for quality control and routine analysis.
The automatic sampler can accommodate samples of different sizes, with a maximum sample diameter limit of 96 mm.
You can easily switch samples at any time without interrupting the ongoing scanning process. The system can automatically detect new samples, and the LED can display the status of each scan: prepared, scanned, and completed.
Brooke's material testing platform can perform compression tests up to a limit of 4400 N and tensile tests up to a limit of 440 N. All test benches can be automatically connected together through the system's rotary table without the need for any external cables. By using the provided software, a scheduled scanning test can be set up.
Brooke's heating and cooling tables can reach the limit of 80 º C or temperatures below the ambient temperature by 30 º C. Like other test benches, the heating and cooling benches do not require any additional connections, and the system can automatically identify different test benches. By using heating and cooling stages, samples can be tested under non environmental conditions to evaluate the effect of temperature on the microstructure of the samples.
key pointapplication
By combining materials into composite materials, the resulting components can have higher strength while significantly reducing weight. To further optimize component performance, it is necessary to ensure that the direction of the components can be optimized. One of the commonly used components is fibers, including steel bars in concrete, glass fibers in electronic components, and carbon nanotubes in aviation materials. XRM can be used to detect fibers and composite materials without the need for cross cutting, ensuring that the sample state is not affected during the sample preparation process.
·The direction of embedded objects
·Quantitative analysis of layer thickness, fiber size, and spacing
·Using an in-situ sample stage to detect temperature and physical properties
The development of new drugs is a time-consuming and costly process., XRM can provide real-time internal structure information during the product formulation phase, accelerating the launch of new drugs.
·Determine the compaction density of the tablet
·Measure the uniformity of coating thickness
·Evaluate API distribution
·Detecting micro cracks caused by stress in compacted tablets
·Using in-situ compression to detect mechanical properties
Foam materials are widely used in industry. According to the material and structural characteristics of foam, it can be used as heat insulation or sound insulation materials, as well as as shock absorption structures in protection or filtering devices
XRM can realize 3D visualization of the internal structure of foam losslessly.
·Determine the thickness of local structures
·Determine structural intervals to achieve visualization of gap networks
·Conducting in-situ mechanical tests using compression and tension tables
·Determine open porosity and closed porosity
Electronic geology
Wood food
| feature |
parameter |
advantage |
| X-ray source |
40~100 kV 10 W <5 μ M-point size, 4 W |
Maintenance-free, fully sealed X-ray source Quality control achieved through rapid scanning, or 4D XRM |
| X-ray detector |
CMOS detector 16 Mp (4096 x 4096) |
Precision arranged detectors can achieve the highest resolution |
| Sample size |
Maximum diameter 75 millimeters Maximum height of 80 millimeters |
Suitable for small to medium-sized samples |
| Automatic sampler (optional) |
16 samples with a maximum diameter of 50 mm 8 samples with a maximum diameter of 96 mm External |
Unattended, high-throughput Random combination of samples of different sizes Add/remove samples at any time without interrupting the scanning process |
| size |
1160mm x 520mm x 330mm (width x depth x height) Weight 150 kilograms Optional automatic sampler |
Space saving desktop system suitable for every laboratory |
| source |
100-240V, 50-60Hz, maximum 3A | The installation requirements are the lowest, and the standard power supply can meet the requirements |