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Current location:
Home
Product
Surface analysis
Food Chemicals
Biomedicine
光电直读光谱仪(OES)
等离子体发射光谱仪(ICP)
New Energy
SEM
XRM
Analysis Meter
Rheometer
Densitometer
Tension Meter
Laser particle analyzer
Raman
Battery calorimeter
Foam Analyzer
Contact angle meter
Nano-indenter
Surface analysis
X-ray photoelectron spectrometer
Time of flight secondary ion mass spectrometer
Scanning Auger nanoprobes
atomic force microscope
Optical profilometer
Ion source system
Semiconductor
X-ray crystal orientator
QSS
Photovoltaic
PID tester for battery cells (PIDcon bifacial)
Portable on-site PID tester (PIDcheck)
PID operation software (PIDStudio)
Minority carrier lifetime tester (MDPspot)
Online minority carrier lifetime tester (MDPLinescan)
Single crystal and polycrystalline silicon wafer lifetime measuring instrument (MDPmap)
Equipment/consumables
Quartz tube/capillary
Single crystal silicon sample holder
ICDD PDF Card
JADE software
ContourX-500
Dimension XR Atomic Force Microscope
Scanning Auger nanoprobes PHI 710
The J105 SIMS
PHI X-tool
PHI - High Performance Time of Flight Secondary Ion Mass Spectrometer
Fully automatic multifunctional scanning focused X-ray photoelectron spectrometer
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