ContourX-500

ContourX family's flagship desktop model, fully automatic design, sample stage with encoder, head tilt design, and AcuityXR for high lateral resolution
The ContourX-500 optical profilometer is the most comprehensive automated desktop system in the world, capable of quickly completing non-contact 3D surface measurement. The ContourX-500 has excellent Z-axis resolution and accuracy, as well as all the industry recognized advantages of Brooke floor standing white light interferometry (WLI) instruments, while occupying a smaller footprint. This profilometer can be easily and autonomously configured, suitable for a wide range of complex applications, from quality assurance/quality control (QA/QC) metrology for precision machined surfaces and semiconductor processes to the development and characterization of ophthalmology and microelectromechanical systems (MEMS) devices.

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Specially designed for outstanding desktop metrology

Brooke's proprietary optical head tilt/pitch technology provides users with great flexibility in production settings and testing. Brooke combines the automatic tilt/tilt function with the optical path in the microscope lens, achieving the integration of detection points and line of sight without being affected by tilt, thereby reducing operator intervention and providing maximum reproducibility. Other hardware features include innovative workbench design that can enhance splicing capabilities; Equipped with a 5MP camera and a 1200x1000 measurement array, it can reduce noise, expand field of view, and improve lateral resolution. The ContourX-500 integrates these functions with automated platform settings and objective lenses, and occupies only a small space, making it an ideal system for on-demand measurement research and industrial metrology.

The traditional pitch rolling workbench design requires operators to adjust five rotation axes to keep the detection points in line of sight for measurement. Brooke's unique optical head tilt/tilt design, unaffected by tilt, can keep the line of sight at the detection point, optimizing image acquisition and significantly reducing data acquisition time.

Directly using multiple analyses

ContourX-500 adopts Brooke's simple yet powerful VisionXpress ™ And Vision64 ® User interface, providing thousands of custom analyses to improve the efficiency of laboratories and factories. Brooke's new Universal Scanning Interferometry (USI) measurement mode provides fully automatic, self sensing surface texture, optimized signal processing, and performs the most accurate and practical calculations on the analyzed surface morphology.

Analyze the bottom channels of microfluidic devices and extract them directly from multiple regions of Vision64.