D8 DISCVER X-ray diffractometer

D8 DISCVER is the flagship multifunctional X-ray diffractometer with many cutting-edge technology components. It is designed specifically for structural characterization of various materials, from powders, amorphous and polycrystalline materials to epitaxial multilayer films, under both environmental and non environmental conditions.

Application scope:

• Qualitative and quantitative phase analysis, structural determination and refinement, microstrain and microcrystalline size analysis
• X-ray reflection method, grazing incidence diffraction (GID), in-plane diffraction, high-resolution XRD, GISAXS, GI stress analysis, crystal orientation analysis
• Residual stress analysis, texture and pole diagram, micro area X-ray diffraction, wide-angle X-ray scattering (WAXS)

• Total scattering analysis: Bragg diffraction, distribution function (PDF), small angle X-ray scattering (SAXS)
  

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Thin film analysis

X-ray diffraction (XRD) and reflectance are important methods for non-destructive characterization of thin layer structured samples. D8 DISCVER and DIFFRAC SUITE software will help you easily perform thin film analysis using common XRD methods:

• Grazing incidence diffraction (GID): Sensitive identification of crystal surface and determination of structural properties, including microcrystalline size and strain.
• X-ray reflectance measurement (XRR): used to extract thickness, material density, and interface structure information of multi-layer samples from simple substrates to highly complex superlattice structures.
• High resolution X-ray diffraction (HRXRD): used to analyze the composition of epitaxial growth structures, including layer thickness, strain, relaxation, inlay, and mixed crystals.
• Stress and texture (preferred orientation) analysis.

Materials research

XRD can study the structure and physical properties of materials and is one of the most important materials research tools. D8 DISCVER is the flagship XRD instrument launched by Brooke for material research. The D8 DISCVER is equipped with technological components that can bring you excellent performance and full flexibility, while allowing researchers to finely characterize the materials:

• Qualitative phase analysis and structural determination
• Analysis of Micron Strain and Microcrystalline Size
• Stress and Texture Analysis
• Determination of particle size and particle size distribution
• Local XRD analysis using micrometer sized X-ray beams
• Reciprocal spatial scanning

Filtering and Large Area Scanning

When it comes to high-throughput screening (HTS) and large-scale scanning analysis, D8 DISCVER is an excellent solution. With the support of the UMC sample stage, the D8 DISCVER has become an outstanding example in terms of electric displacement and weight capacity:

• High throughput screening (HTS) of orifice plates and sedimentary samples in reflection and transmission
• Scan the sample with a maximum/maximum size of 300 mm
• Install and scan samples weighing no more than 5kg
• Automation interface

Microfocal source I µ S

The I µ S microfocal source equipped with MONTEL optical devices can provide high/intensity small X-ray beams, making it very suitable for research on small ranges or samples.

• Millimeter sized beam: high brightness and low background
• Green and environmentally friendly design: low power consumption, no water consumption, and extended service life
• MONTEL optical devices can optimize beam shape and divergence

• Fully compatible with Brooke's extensive components, optical devices, and detectors.
  

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UMC sample stage

D8 DISCVER offers many UMC platforms with new sample scanning and weight holding capabilities:

• Can scan samples weighing up to 5 kg
• Large area mapping: samples with a maximum/maximum size of 300mm
• A UMC sample stage that supports high-throughput screening (HTS) and supports up to three well plates.

Considering its highly modular performance, the UMC sample stage can be customized beyond the standard configuration according to customer requirements.

Multimode EIGER2 R detector

EIGER2 R 250K and 500K are 2D detectors that incorporate synchrotron performance into laboratory X-ray diffraction.

• Advanced sensor design, including second-generation EIGER: maximum/maximum size of 75 x 75mm ² With 500000 pixels, it can achieve macro coverage with micro resolution.
  
• Ergonomic design: Easy to adjust the position and direction of the detector according to application needs, including tool free switching at 0 °/90 °, continuous change of detector position, and support for automatic lighting.
• Panoramic optical components and accessories provide a wide field of view.
• 0D, 1D, and 2D operation modes: Supports snapshot, step, continuous, or advanced scanning modes.
• Can work with DIFFRAC SUITE is fully seamlessly integrated.

TRIO Optics and PATHFINDER PLUS Optics

ObtainThe TRIO optical device obtained can automatically switch between three optical paths:

• Bragg Brentano focusing geometry for powders
• High/intensity parallel beam K for capillary, GID, and XRR analysis α 1,2 Geometry
• High resolution parallel beam K for epitaxial thin films α 1 Geometry

The PATHFINDERPlus optical device comes with a linear automatic absorber to ensure measured intensity and can switch between:

• Electric slits: for high-throughput measurement
• Spectral crystals: used for high-resolution measurements

Using the D8 DISCVER equipped with TRIO and PATHFINDERPlus, there is no need to reconfigure, and all types including powders, bulk materials, fibers, sheets, and thin films (amorphous, polycrystalline, and epitaxial) can be mastered under environmental or non environmental conditions.