Including the most complete electrical AFM technology for characterizing functional materials, semiconductors, and energy research.
Provide the highest resolution complete solution for quantitative analysis of local electrochemical activity related to batteries, fuel cells, and corrosion at the nanoscale.
Provide a complete quantitative solution for characterizing the structure and nanomechanical properties of materials.
With a complete set of excellent AFM imaging modes, Brooke can provide you with suitable AFM technology for each of your studies.
Based on the core imaging modes (contact mode and tap mode), Brooke provides a complete set of AFM testing modes, allowing users to detect the rich performance of samples such as electrical and magnetic properties. Brooke's innovative peak force tapping technology, as a new core imaging mode, has been applied to multiple measurement modes, providing morphology, electrical, and mechanical performance data simultaneously.
XR nanomechanics provides a series of advanced application modes, and its sub molecular resolution can achieve comprehensive research on the minimum structural elements of polymer chains. Researchers combined nanomechanical data with macroscopic dynamic mechanical analysis and nanoindentation studies with Brooke's proprietary AFM-nDMA ™ Pattern association. From soft viscous hydrogels and composites to hard metals and ceramics, quantitative nanoscale characterization has been achieved.
The Nanoelectronics package of Dimension XR covers the widest range of AFM electrical technologies. Researchers use a proprietary DataCube pattern to capture electrical information for each pixel and correlate it with mechanical performance characterization results, providing information that was previously unavailable under single measurement conditions.
The Dimension XR nano electrochemical configuration can achieve stable scanning electrochemical microscopy (AFM-SECM) and electrochemical AFM (EC-AFM) functions based on AFM. Researchers can simultaneously collect the nanoscale electrochemical, electrical, and mechanical properties of materials in this system.
These modes utilize fast force array modes to perform force curve measurements at each pixel point and have user-defined dwell time data collection. Using high-speed data capture function, multiple electrical measurements are performed during the dwell period to generate electrical and mechanical spectra at each pixel. The data cube pattern provides a complete representation in a single measurement, which is unheard of in commercial AFM.
The peak force tapping scanning probe microscope with nanoscale spatial resolution redefines the characterization of electrochemical processes at the nanoscale in liquids. The peak force tapping scanning probe electrochemical microscope significantly improves the resolution compared to traditional methods in terms of magnitude. This opens the door to new measurements of individual nanoparticles, nanophases, and nanopores in energy storage systems, corrosion science, and biosensors. Only peak force tapping scanning probe electrochemical microscopy can simultaneously obtain morphology, electrochemistry, electrical, and mechanical distribution maps, and has nanoscale lateral resolution.